SCANSTA111SMX - Brand New Texas Instruments Interface - Specialized
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Description
The SCANSTA111SMX is a high-speed, low-power D-type flip-flop that features separate D-type inputs organized into dual 9-bit bytes. It also includes byte-oriented clock and output enable control signals. This electronic component is compliant with the IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture. It incorporates the defined BOUNDARY-SCAN test logic and test access port, which consists of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).
Specifications and features
- IEEE 1149.1 (JTAG) Compliant
- Buffered positive edge-triggered clock
- 3-STATE outputs for bus-oriented applications
- 9-bit data busses for parity applications
- Reduced-swing outputs source 32 mA/sink 64 mA
- Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V and 2.0V
- TTL compatible inputs
- 25 mil pitch SSOP (Shrink Small Outline Package)
- Includes CLAMP and HIGHZ instructions
- Member of Fairchild’s SCAN Products
Application Scenarios
The SCANSTA111SMX is often used in applications that require high speed, low-power D-type flip-flops. It is especially useful in applications where separate D-type inputs and byte-oriented control signals are needed. The component's compliance with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture makes it suitable for applications that require efficient testing and debugging capabilities.
Comparison
Advantages- Compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture
- High-speed operation
- Low-power consumption
- Includes CLAMP and HIGHZ instructions for added functionality
Disadvantages- Requires a 25 mil pitch SSOP (Shrink Small Outline Package) for installation
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Similar parts: 4284 , Click to view
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Datasheet
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Shopping guide
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Popular parts of the same kind
- Datasheet: Download SCANSTA111SMX
- Chipdatas Part: CD93-SCANSTA111SMX
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- Last Updated: 2024/10/02 11:21 +0800
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