Description

The electronic component model RTM875N-606-VD-GRT is an IC chip used in various electronic devices. It is a measurement equipment designed to measure clock rise time, fall time, clock jitter, duty cycle, and other parameters. The measurement is performed using Tektronix® 6804B with single-ended and differential probes. The measurement environment includes a test board, and the measurement items include differential clock measurements and single-end clock measurements. Overall, the RTM875N-606-VD-GRT is proven to work well and meet all CLK specifications.

Specifications and features

• Mainframe with 8.0GHz Bandwidth
• Mainframe with 20GS/s Sampling Rate
• P7240 Active Probe with 4.0GHz Bandwidth (input: 1.0pF / 20K-ohm)
• P7330 Differential Active Probe with 3.5GHz Bandwidth (input: 0.5pF / 100K-ohm)
• Tektronix® Jitter Analysis 3® Jitter Measurement Software

Application Scenarios

The RTM875N-606-VD-GRT is widely used in the electronics industry for measuring clock signals in various electronic devices. It is commonly used in the development and testing of telecommunications equipment, consumer electronics, and other devices where accurate and reliable clock measurements are critical.

Comparison

- Wide bandwidth range of 8.0GHz for accurate measurements.

- High sampling rate of 20GS/s for capturing fast clock signal transitions.

- Active probes with bandwidths of 4.0GHz and 3.5GHz for precise measurements.

- Jitter measurement software for detailed analysis of clock jitter.

- No specific disadvantages have been reported for the RTM875N-606-VD-GRT model.